
ISTFA 2025
[vc_row][vc_column width="3/4"][vc_row_inner][vc_column_inner][vc_column_text css=""] The 51st International Symposium for Testing and Failure Analysis (ISTFA 2025) The 51st International Symposium for Testing and Failure Analysis (ISTFA) will take place on November 16-20, 2025, in Pasadena, California. This event, organised by ASM International, focuses on microelectronics failure analysis, with the main theme of “Scaling Beyond Moore’s Law: Heterogeneous Computing and Advanced Packaging”, which echoes reshaping the landscape toward integration of diverse technologies. [/vc_column_text][/vc_column_inner][/vc_row_inner][vc_row_inner css=".vc_custom_1762779912839{background-color: #D9D9D9 !important;}"][vc_column_inner width="1/2"][vc_cta h2="" txt_align="center" style="3d" color="mulled-wine" add_button="bottom" btn_title="More About SEM" btn_style="3d" btn_color="juicy-pink" btn_align="center" css="" btn_link="url:https%3A%2F%2Fvaccoat.com%2Fblog%2Fscanning-electron-microscope-sem%2F|title:Scanning%20Electron%20Microscope%20(SEM)"][/vc_cta][/vc_column_inner][vc_column_inner width="1/2"][vc_cta h2="" txt_align="center" style="3d" color="mulled-wine" add_button="bottom" btn_title="SEM Coaters" btn_style="3d" btn_color="juicy-pink" btn_align="center" css="" btn_link="url:https%3A%2F%2Fvaccoat.com%2Fsem-coater%2F|title:SEM%20Coaters%20%7C%20Coating%20Techniques%20for%20SEM"][/vc_cta][/vc_column_inner][/vc_row_inner][vc_row_inner][vc_column_inner][vc_column_text css=""] This event brings together experts and researchers working in the field of semiconductor device testing and failure analysis, offering technical sessions, workshops, and an exhibition. Renowned electron microscope manufacturers,…
