Field Emission Scanning Electron Microscope (FE-SEM)

Field Emission Scanning Electron Microscope (FE-SEM)

Pulsed Laser deposition, Sputter Coater, Thermal evaporation
Optical microscopes have a maximum magnification of 2000 times the magnification that is often not enough. To see particles that are smaller than the wavelength of light, we need to have very small particles so that they can be traced back to the target and visualized very small particles. The best particle for this purpose is electron. Electron is a charged and fundamental particle that can improve the magnification up to a million times. Scanning electron microscopy is an efficient and non-destructive technique that provides detailed information on the morphology, composition and structure of the studied materials. The first scanning electron microscope was invented in 1942. It was shown at that time that Secondary Electrons (SE) produced topographic contrast using the collector positive bias rather than the sample. After that,…
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