The 51st International Symposium for Testing and Failure Analysis (ISTFA 2025)
The 51st International Symposium for Testing and Failure Analysis (ISTFA) will take place on November 16-20, 2025, in Pasadena, California.
This event, organised by ASM International, focuses on microelectronics failure analysis, with the main theme of “Scaling Beyond Moore’s Law: Heterogeneous Computing and Advanced Packaging”, which echoes reshaping the landscape toward integration of diverse technologies.
This event brings together experts and researchers working in the field of semiconductor device testing and failure analysis, offering technical sessions, workshops, and an exhibition. Renowned electron microscope manufacturers, including Zeiss, TESCAN, JEOL, and Thermo Fisher Scientific, exhibit at this event, as SEM analysis and electron microscope imaging of microelectronic devices have become a key step in the device fabrication process.
